標題: Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
作者: Pearn, WL
Shu, MH
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: process capability index;lower confidence bound
公開日期: 1-Jan-2004
摘要: Several process capability indices, including C-p, C-pk, and C-pm, have been proposed to provide numerical measures on manufacturing potential and actual performance. Combining the advantages of those indices, a more advanced index C-pmk is proposed, taking the process variation, centre of the specification tolerance, and the proximity to the target value into account, which has been shown to be a useful capability index for manufacturing processes with two-sided specification limits. In this paper, we consider the estimation of C-pmk, and we develop an efficient algorithm to compute the lower confidence bounds on C-pmk based on the estimation, which presents a measure on the minimum manufacturing capability of the process based on the sample data. We also provide tables for practitioners to use in measuring their processes. A real-world example of current transmitters taken from a microelectronics device manufacturing process is investigated to illustrate the applicability of the proposed approach. Our implementation of the existing statistical theory for manufacturing capability assessment bridges the gap between the theoretical development and the in-plant applications.
URI: http://dx.doi.org/10.1007/s00170-003-1693-z
http://hdl.handle.net/11536/27221
ISSN: 0268-3768
DOI: 10.1007/s00170-003-1693-z
期刊: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume: 23
Issue: 1-2
起始頁: 116
結束頁: 125
Appears in Collections:Articles


Files in This Item:

  1. 000187549000014.pdf