標題: Scrapping small lots in a low-yield and high-price scenario
作者: Wu, MC
Chiou, CW
Hsu, HM
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: bottleneck;high price;low yield;product introduction;small lots
公開日期: 1-Feb-2004
摘要: Some wafers in a lot may become spoiled after they are processed at a workstation; such a lot is called a small lot. In a low yield and high price scenario, scrapping small lots may increase revenue and profit; yet, this notion has seldom been examined. This study presents a model for formulating the decision-making problem of scrapping small lots. A genetic algorithm is used to solve the problem when the solution space is large. An exhaustive search method is used when the solution space is small. Some numerical examples are used to evaluate the outcome of scrapping small lots. The profit obtained by the proposed scrapping method may be up to 23% higher than that obtained without scrapping.
URI: http://dx.doi.org/10.1109/TSM.2003.822732
http://hdl.handle.net/11536/27108
ISSN: 0894-6507
DOI: 10.1109/TSM.2003.822732
期刊: IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
Volume: 17
Issue: 1
起始頁: 55
結束頁: 67
Appears in Collections:Articles