標題: Improved technique for measuring small angles
作者: Chiu, MH
Su, DC
交大名義發表
光電工程學系
National Chiao Tung University
Department of Photonics
關鍵字: total-internal-reflection effect;heterodyne interferometry
公開日期: 1-十月-1997
摘要: Based on the total-internal-reflection effect and heterodyne interferometry, an improved technique for measuring small angles is proposed. This technique not only expands the measurement range but it also improves measurement performances. Its validity is demonstrated. (C) 1997 Optical Society of America.
URI: http://hdl.handle.net/11536/270
ISSN: 0003-6935
期刊: APPLIED OPTICS
Volume: 36
Issue: 28
起始頁: 7104
結束頁: 7106
顯示於類別:期刊論文


文件中的檔案:

  1. A1997XX49600002.pdf