標題: Accuracy analysis of the estimated process treld based onS(pk)
作者: Pearn, WL
Chuang, CC
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: process yield measure;relative bias;relative mean square error
公開日期: 1-Jun-2004
摘要: Process yield has been the most basic and common criterion used in the manufacturing industry as a base for measuring process performance. Boyles considered a measurement formula called S-pk, which establishes the relationship between the manufacturing specification and the actual process performance, providing an exact (rather than approximate) measure of process yield. Unfortunately, the sampling distribution and the associated statistical properties of Spk are analytically intractable. In this paper, we consider the natural estimator of the measure S-pk. We investigate the accuracy of the natural estimator of S-pk computationally, using a simulation technique to find the relative bias and the relative mean square error for some commonly used quality requirements. Extensive simulation results are provided and analyzed, which are useful to the engineers for factory applications in measuring process performance. Copyright (C) 2004 John Wiley Sons, Ltd.
URI: http://dx.doi.org/10.1002/qre.544
http://hdl.handle.net/11536/26728
ISSN: 0748-8017
DOI: 10.1002/qre.544
期刊: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume: 20
Issue: 4
起始頁: 305
結束頁: 316
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