標題: Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
作者: Pearn, WL
Shu, MH
Hsu, BM
工業工程與管理學系
Department of Industrial Engineering and Management
公開日期: 15-Jun-2004
摘要: For stably normal processes with one-sided specification limits, capability indices C-PU and C-PL have been used to provide numerical measures on production yield assurance. Statistical properties of the estimators of C-PU and C-PL have been investigated extensively for cases with a single sample. It is shown that for multiple samples, the uniformly minimum-variance unbiased estimators of C-PU and C-PL are consistent and asymptotically efficient. Based on the uniformly minimum-variance unbiased estimators, an algorithm is developed with an efficient program using a direct search method to compute the lower confidence bounds for C-PU and C-PL. The lower confidence bounds convey critical information to the minimum capability of a process, providing a necessary yield assurance of production. The lower confidence bounds are tabulated for some commonly used capability requirement so that engineers/practitioners can use them for their in-plant applications. An example of a high-speed buffer amplifier is presented to illustrate the practicality of the approach to data collected from the factories for production yield assurance.
URI: http://dx.doi.org/10.1080/00207540310001652888
http://hdl.handle.net/11536/26668
ISSN: 0020-7543
DOI: 10.1080/00207540310001652888
期刊: INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
Volume: 42
Issue: 12
起始頁: 2339
結束頁: 2356
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