標題: NEW OBSERVATION OF CHARGE INJECTION IN MOS ANALOG SWITCHES
作者: CHEN, MJ
GU, YB
WU, T
HSU, PC
LIU, TH
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: INTEGRATED CIRCUITS;SWITCHED CAPACITOR NETWORKS
公開日期: 3-二月-1994
摘要: Based on experimental analogue MOS switches, the Letter reports a new observation of the charge injection component due to channel charges in weak inversion. As identified by the mixed-mode circuit and device simulations, this new component can contribute comparably to the switch-induced error voltage on a switched capacitor.
URI: http://dx.doi.org/10.1049/el:19940177
http://hdl.handle.net/11536/2618
ISSN: 0013-5194
DOI: 10.1049/el:19940177
期刊: ELECTRONICS LETTERS
Volume: 30
Issue: 3
起始頁: 213
結束頁: 214
顯示於類別:期刊論文


文件中的檔案:

  1. A1994MX97100030.pdf