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dc.contributor.authorLagutchev, ASen_US
dc.contributor.authorSong, KJen_US
dc.contributor.authorHuang, JYen_US
dc.contributor.authorYang, PKen_US
dc.contributor.authorChuang, TJen_US
dc.date.accessioned2014-12-08T15:01:24Z-
dc.date.available2014-12-08T15:01:24Z-
dc.date.issued1997-10-01en_US
dc.identifier.issn0257-8972en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0257-8972(97)00452-0en_US
dc.identifier.urihttp://hdl.handle.net/11536/259-
dc.description.abstractSelf-assembled monolayers of fluorinated and non-fluorinated alkylsiloxanes were prepared on fused silica substrates and studied by both conventional IR and nonlinear sum-frequency vibrational spectroscopy complemented with XPS. Simultaneous self-assembly of the two alkylsiloxanes results in preferential adsorption of the fluorinated compound and formation of the mixed monolayer. Different species are found to be closely coadsorbed in the mixed monolayers which distinguishes self-assembly from Langmuir-Blodgett deposition where the similar species tend to separate into different phases. Nonlinear sum-frequency spectroscopy of C-H stretching region detects symmetry perturbations of the alkyl chain induced by trans-cis defects and partial fluorination and clearly distinguishes between them. All three characterization methods consistently indicate the presence of a hydrocarbon residue in all deposited monolayers, which is ascribed to the hexadecane used as a solvent during the self-assembly process. (C) 1997 Elsevier Science S.A.en_US
dc.language.isoen_USen_US
dc.subjectself-assemblyen_US
dc.subjectmonolayersen_US
dc.subjectsum-frequency spectroscopyen_US
dc.titleSum-frequency vibrational spectroscopic study of mixed alkylsiloxane monolayers self-assembled on fused silica surfaceen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/S0257-8972(97)00452-0en_US
dc.identifier.journalSURFACE & COATINGS TECHNOLOGYen_US
dc.citation.volume94-5en_US
dc.citation.issue1-3en_US
dc.citation.spage383en_US
dc.citation.epage389en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000070981000066-
Appears in Collections:Conferences Paper


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