標題: Testing Methods for Detecting Stuck-open Power Switches in Coarse-Grain MTCMOS Designs
作者: Mu, Szu-Pang
Wang, Yi-Ming
Yang, Hao-Yu
Chao, Mango C. -T.
Chen, Shi-Hao
Tseng, Chih-Mou
Tsai, Tsung-Ying
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2010
摘要: Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switches. In this paper, we study the usage of coarse-grain MTCMOS power switches for both logic circuits and SRAMs, and then propose corresponding methods of testing stuck-open power switches for each of them. For logic circuits, a specialized ATPG framework is proposed to generate a longest possible robust test while creating as many effective transitions in the switch-centered region as possible. For SRAMs, a novel test algorithm is proposed to exercise the worst-case power consumption and performance when stuck-open power switches exist. The experimental results based on an industrial MTCMOS technology demonstrate the advantage of our proposed testing methods on detecting stuck-open power switches for both logic circuits and SRAMs, when compared to conventional testing methods.
URI: http://hdl.handle.net/11536/25931
http://dx.doi.org/10.1109/ICCAD.2010.5654118
ISBN: 978-1-4244-8192-7
ISSN: 1933-7760
DOI: 10.1109/ICCAD.2010.5654118
期刊: 2010 IEEE AND ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)
起始頁: 155
結束頁: 161
Appears in Collections:Conferences Paper


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