標題: Large field-induced strains in a lead-free piezoelectric material
作者: Zhang, J. X.
Xiang, B.
He, Q.
Seidel, J.
Zeches, R. J.
Yu, P.
Yang, S. Y.
Wang, C. H.
Chu, Y-H
Martin, L. W.
Minor, A. M.
Ramesh, R.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 1-二月-2011
摘要: Piezoelectric materials exhibit a mechanical response to electrical inputs, as well as an electrical response to mechanical inputs, which makes them useful in sensors and actuators(1). Lead-based piezoelectrics demonstrate a large mechanical response, but they also pose a health risk(2). The ferroelectric BiFeO(3) is an attractive alternative because it is lead-free, and because strain can stabilize BiFeO(3) phases with a structure that resembles a morphotropic phase boundary(3). Here we report a reversible electric-field-induced strain of over 5% in BiFeO(3) films, together with a characterization of the origins of this effect. In situ transmission electron microscopy coupled with nanoscale electrical and mechanical probing shows that large strains result from moving the boundaries between tetragonal- and rhombohedral-like phases, which changes the phase stability of the mixture. These results demonstrate the potential of BiFeO(3) as a substitute for lead-based materials in future piezoelectric applications.
URI: http://dx.doi.org/10.1038/nnano.2010.265
http://hdl.handle.net/11536/25850
ISSN: 1748-3387
DOI: 10.1038/nnano.2010.265
期刊: NATURE NANOTECHNOLOGY
Volume: 6
Issue: 2
起始頁: 97
結束頁: 101
顯示於類別:期刊論文


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  1. 000286968500009.pdf