標題: Critical length of nanowires for hydrophobic behavior
作者: Cheng, YH
Chou, CK
Chih, C
Cheng, SY
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 11-十月-2004
摘要: This Letter investigates the wetting behavior on surface with well-controlled nanoscale structure. Water and water-alcohol droplets were brought to contact the surface electroplated by Ag nanowires. It is found that hydrophobic behavior becomes more pronounced as the length of the nanowires increases. A critical length of approximately 100 nm is observed, beyond which the contact angle approaches a steady value of 130degrees. In addition, the contact angle of water levels off around 160degrees when the length of the fluorine-coated Ag nanowires exceeds the critical value of 100 nm. The mechanism of the hydrophobic behavior on surface with nanoscale structure is proposed. (C) 2004 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.cplett.2004.08.063
http://hdl.handle.net/11536/25766
ISSN: 0009-2614
DOI: 10.1016/j.cplett.2004.08.063
期刊: CHEMICAL PHYSICS LETTERS
Volume: 397
Issue: 1-3
起始頁: 17
結束頁: 20
顯示於類別:期刊論文


文件中的檔案:

  1. 000224368100004.pdf