Title: Diagnosability of t-connected networks and product networks under the comparison diagnosis model
Authors: Chang, CP
Lai, PL
Tan, JJM
Hsu, LH
資訊工程學系
Department of Computer Science
Keywords: diagnosability;comparison diagnosis model;t-diagnosable;connectivity;order graph;product networks
Issue Date: 1-Dec-2004
Abstract: Diagnosability is an important factor in measuring the reliability of an interconnection network, while the (node) connectivity is used to measure the fault tolerance of an interconnection network. We observe that there is a close relationship between the connectivity and the diagnosability. According to our results, a t-regular and t-connected network with at least 2t + 3 nodes is t-diagnosable. Furthermore, the diagnosability of the product networks is also investigated in this work. The product networks, including hypercube, mesh, and tori, comprise very important classes of interconnection networks. Herein, different combinations of t-diagnosable and t-connected are employed to study the diagnosability of the product networks.
URI: http://dx.doi.org/10.1109/TC.2004.114
http://hdl.handle.net/11536/25570
ISSN: 0018-9340
DOI: 10.1109/TC.2004.114
Journal: IEEE TRANSACTIONS ON COMPUTERS
Volume: 53
Issue: 12
Begin Page: 1582
End Page: 1590
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