標題: The potential of functional scaling
作者: Chin, A
McAlister, SP
奈米科技中心
Center for Nanoscience and Technology
公開日期: 1-Jan-2005
URI: http://dx.doi.org/10.1109/MCD.2005.1388766
http://hdl.handle.net/11536/25366
ISSN: 8755-3996
DOI: 10.1109/MCD.2005.1388766
期刊: IEEE CIRCUITS & DEVICES
Volume: 21
Issue: 1
起始頁: 27
結束頁: 35
Appears in Collections:Articles


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