標題: Bootstrap approach for estimating process quality yield with application to light emitting diodes
作者: Pearn, WL
Chang, YC
Wu, CW
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: bootstrap methods;lower confidence bound;process capability indices;quality yield;simulation
公開日期: 2005
摘要: Process capability indices have been widely used by quality professionals for measuring process performance. Although process yield is the most common criterion used in the manufacturing industry for measuring process performance, a more advanced measurement formula Y-q, called quality yield index, has been proposed as an alternative measure of process performance. Quality yield can be viewed as the classical process yield minus the truncated expected relative process loss, within the specifications, which focuses on customer satisfaction. By taking customer loss into consideration, the advantage of using the quality-yield measure as process performance is that the formula can be applied to processes with arbitrary distributions. Unfortunately, statistical properties of the estimated Y-q are mathematically intractable. Therefore, capability testing cannot be performed. In this paper, a nonparametric but computer intensive method called bootstrap is used to obtain a lower confidence bound on quality yield for capability testing purposes. Simulation studies are conducted to examine the sampling distribution of the estimated Y-q. An application using the index Y-q for the light emitting diode manufacturing process is presented for illustration purposes.
URI: http://hdl.handle.net/11536/25244
http://dx.doi.org/10.1007/s00170-003-1879-4
ISSN: 0268-3768
DOI: 10.1007/s00170-003-1879-4
期刊: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume: 25
Issue: 5-6
起始頁: 560
結束頁: 570
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