標題: Practical Routability-Driven Design Flow for Multilayer Power Networks Using Aluminum-Pad Layer
作者: Chang, Wen-Hsiang
Chao, Mango C. -T.
Chen, Shi-Hao
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Electro-migration (EM);IR drop;power network;routing-driven
公開日期: 1-May-2014
摘要: This paper presents a novel framework to efficiently and effectively build a robust but routing-friendly multilayer power network under the IR-drop and electro-migration (EM) constraints. The proposed framework first considers the impact of the aluminum-pad layer and provides a conservative analytical model to determine the total metal width for each power layer that can meet the IR-drop and EM constraints. Then the proposed framework can identify an optimal irredundant stripe width by considering the number of occupied routing tracks and the potential routing detour caused by the power stripes without the information of cell placement. Next, after the cell placement is done, the proposed framework applies a dynamic-programming approach to further reduce the potential routing detour by relocating the power stripes. A series of experiments are conducted based on a 40 nm, 1.1 V, and 900-MHz microprocessor to validate the effectiveness and efficiency of the proposed framework.
URI: http://dx.doi.org/10.1109/TVLSI.2013.2264686
http://hdl.handle.net/11536/24732
ISSN: 1063-8210
DOI: 10.1109/TVLSI.2013.2264686
期刊: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume: 22
Issue: 5
起始頁: 1069
結束頁: 1081
Appears in Collections:Articles


Files in This Item:

  1. 000337159500011.pdf