標題: Full-field refractive index measurement with simultaneous phase-shift interferometry
作者: Chu, Yen-Chang
Chang, Wei-Yao
Chen, Kun-Huang
Chen, Jing-Heng
Tsai, Bo-Chung
Hsu, Ken Y.
光電工程學系
Department of Photonics
關鍵字: Full-field refractive index;Simultaneous phase-shift interferometry;Total internal reflection
公開日期: 2014
摘要: Using the phenomenon of total internal reflection and a beam splitting device, a technique of simultaneous phase-shift interferometry is proposed for measuring the full-field refractive index. Because this method applies a beam splitting device that mimics the characteristics of beam splitting and phase modulation, four interferemetric images of various phase distributions can be simultaneously captured. Therefore, this setup can avoid errors caused by non-simultaneous capturing of images and offers the benefits of high stability, ease of operation, and real-time measurement. Furthermore, using the phenomenon of total internal reflection, the phase difference between p- and s-polarized light varies considerably with the refractive index of a tested specimen. This can substantially increase the measurement resolution. The feasibility of this method is verified using an experiment, and the measurement resolution can be higher than 3.65 x 10(-4) RIU. (C) 2014 Elsevier GmbH. All rights reserved.
URI: http://hdl.handle.net/11536/24581
http://dx.doi.org/10.1016/j.ijleo.2013.12.059
ISSN: 0030-4026
DOI: 10.1016/j.ijleo.2013.12.059
期刊: OPTIK
Volume: 125
Issue: 13
起始頁: 3307
結束頁: 3310
顯示於類別:期刊論文


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  1. 000337656400069.pdf