標題: GROWTH OF HIGHLY ORIENTED ZRTIO(4) THIN-FILMS BY RADIOFREQUENCY MAGNETRON SPUTTERING
作者: CHANG, DA
LIN, P
TSENG, TY
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 13-六月-1994
摘要: ZrTiO4 thin films on Si(100), metals [Al, Ti and Pt coated on Si(100)] and glass were prepared by radio-frequency magnetron sputter deposition. All films on crystalline substrates exhibited a highly preferred orientation in [020], which were evidenced by the full width at half-maximum (less-than-or-equal-to 0.046-degrees) of the associated rocking curves. The structure of the films on glass, depending on the substrate temperature, was either amorphous or random polycrystalline Good stoichiometric quality and thermal stability have been observed in films on silicon. The X-ray diffraction and transmission electron microscopy selected-area diffraction studies indicated that, after a sequence of annealing up to 650-700-degrees-C, the distributions of Zr and Ti ions in the octahedral cation sites of crystal structure of the films remained disordered.
URI: http://dx.doi.org/10.1063/1.111947
http://hdl.handle.net/11536/2453
ISSN: 0003-6951
DOI: 10.1063/1.111947
期刊: APPLIED PHYSICS LETTERS
Volume: 64
Issue: 24
起始頁: 3252
結束頁: 3254
顯示於類別:期刊論文


文件中的檔案:

  1. A1994NQ97900017.pdf