標題: DIFFERENTIAL CROSS-SECTIONS FOR PLASMON EXCITATIONS AND REFLECTED ELECTRON-ENERGY-LOSS SPECTRA
作者: TUNG, CJ
CHEN, YF
KWEI, CM
CHOU, TL
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 15-六月-1994
摘要: Electron differential inverse mean free paths for volume-plasmon excitations and differential probabilities for surface-plasmon excitations have been calculated using dielectric response theory. A model dielectric function which satisfied sum rules and agreed with optical data was established for these calculations. In surface-plasmon calculations, we considered electron-impact emissions of the reflected electron-energy-loss spectroscopy. Formulations were made for obliquely incident electrons with the recoil effect and without the small-scattering-angle assumption. For volume-plasmon excitations, we evaluated corrections due to the exchange and Z1(3) effects. Comparison between calculated results and experimental data extracted from reflected electron-energy-loss spectra showed good agreement. Calculated differential cross sections have been used to solve the transport equation for the angular and energy flux spectra of reflected electrons. Contributions to the spectra from single and plural plasmon excitations were analyzed. It was found that calculated spectra were in good agreement with measured data.
URI: http://dx.doi.org/10.1103/PhysRevB.49.16684
http://hdl.handle.net/11536/2450
ISSN: 0163-1829
DOI: 10.1103/PhysRevB.49.16684
期刊: PHYSICAL REVIEW B
Volume: 49
Issue: 23
起始頁: 16684
結束頁: 16693
顯示於類別:期刊論文