標題: Small-pixel TFT flaw detection and measurement using voltage imaging technique
作者: Wang, Yao-Chin
Lin, Bor-Shyh
光電系統研究所
影像與生醫光電研究所
生醫電子轉譯研究中心
Institute of Photonic System
Institute of Imaging and Biomedical Photonics
Biomedical Electronics Translational Research Center
關鍵字: Small-pixel;TFT array;Measurement;Flaw detection;Voltage imaging
公開日期: 1-四月-2014
摘要: The paper proposed the characteristics of flaw measurement in small-pixel design mobile displays based on TFT array panel with respect to electrical-optic characterization. For advanced small-pixel and high-resolution mobile display applications, the display pixels on array process are smaller, detecting small-pixel defect played an important role than previously seen in non-small-pixel TFT array panels for managing process yield. The study resulted in small-pixel size TFT array show the flaw detection performance and preference approaches using the voltage imaging technique. It provides an initial insight into the high-resolution of small-pixel size designs for advanced mobile displays application. (C) 2013 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.measurement.2013.12.011
http://hdl.handle.net/11536/23958
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2013.12.011
期刊: MEASUREMENT
Volume: 50
Issue: 
起始頁: 121
結束頁: 125
顯示於類別:期刊論文


文件中的檔案:

  1. 000333059200016.pdf