標題: Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
作者: Lin, Tzu-Hsuan
Lu, Yung-Chi
Hung, Shih-Lin
土木工程學系
Department of Civil Engineering
公開日期: 2014
摘要: This study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system to locate global damage. Local damage is then identified using an electromechanical impedance-(EMI-) based damage detection method. The electromechanical impedance was measured using a single-chip impedance measurement device which has the advantages of small size, low cost, and portability. The feasibility of the proposed damage detection scheme was studied with reference to a numerical example of a six-storey shear plane frame structure and a small-scale experimental steel frame. Numerical and experimental analysis using the integrated global-local SHM approach reveals that, after NEFDI indicates the approximate location of a damaged area, the EMI-based damage detection approach can then identify the detailed damage location in the structure of the building.
URI: http://hdl.handle.net/11536/23860
http://dx.doi.org/10.1155/2014/729027
ISSN: 1537-744X
DOI: 10.1155/2014/729027
期刊: SCIENTIFIC WORLD JOURNAL
Appears in Collections:Articles


Files in This Item:

  1. 000331898900001.pdf