Full metadata record
DC FieldValueLanguage
dc.contributor.authorKer, MDen_US
dc.contributor.authorKuo, BJen_US
dc.date.accessioned2014-12-08T15:34:04Z-
dc.date.available2014-12-08T15:34:04Z-
dc.date.issued2005-02-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2004.840733en_US
dc.identifier.urihttp://hdl.handle.net/11536/23422-
dc.description.abstractThe capacitive load, from the large electrostatic discharge (ESD) protection device for high ESD robustness, has an adverse effect on the performance of broad-band RF circuits due to impedance mismatch and bandwidth degradation. The conventional distributed ESD protection scheme using equal four-stage ESD protection can achieve a better impedance match, but degrade the ESD performance. A new distributed ESD protection structure is proposed to achieve both good ESD robustness and RF performance. The proposed ESD protection circuit is constructed by arranging ESD protection stages with decreasing device,size, called as decreasing-size distributed electrostatic discharge (DS-DESD) protection scheme, which is beneficial to the ESD level. The new proposed DS-DESD protection scheme With a total capacitance of 200 fF from the ESD diodes has been successfully verified in a 0.25-mum CMOS process to sustain a human-body-model ESD level of greater than 8 kV.en_US
dc.language.isoen_USen_US
dc.subjectcoplanar waveguide (CPW)en_US
dc.subjectdistributed electrostatic discharge (DESD) protectionen_US
dc.subjectelectrostatic discharge (ESD)en_US
dc.subjectresistive ladderen_US
dc.subjectshallow-trench isolation (STI) diodeen_US
dc.titleDecreasing-size distributed ESD protection scheme for broad-band RF circuitsen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1109/TMTT.2004.840733en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume53en_US
dc.citation.issue2en_US
dc.citation.spage582en_US
dc.citation.epage589en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000226910000021-
Appears in Collections:Conferences Paper


Files in This Item:

  1. 000226910000021.pdf