標題: Decreasing-size distributed ESD protection scheme for broad-band RF circuits
作者: Ker, MD
Kuo, BJ
電機學院
College of Electrical and Computer Engineering
關鍵字: coplanar waveguide (CPW);distributed electrostatic discharge (DESD) protection;electrostatic discharge (ESD);resistive ladder;shallow-trench isolation (STI) diode
公開日期: 1-二月-2005
摘要: The capacitive load, from the large electrostatic discharge (ESD) protection device for high ESD robustness, has an adverse effect on the performance of broad-band RF circuits due to impedance mismatch and bandwidth degradation. The conventional distributed ESD protection scheme using equal four-stage ESD protection can achieve a better impedance match, but degrade the ESD performance. A new distributed ESD protection structure is proposed to achieve both good ESD robustness and RF performance. The proposed ESD protection circuit is constructed by arranging ESD protection stages with decreasing device,size, called as decreasing-size distributed electrostatic discharge (DS-DESD) protection scheme, which is beneficial to the ESD level. The new proposed DS-DESD protection scheme With a total capacitance of 200 fF from the ESD diodes has been successfully verified in a 0.25-mum CMOS process to sustain a human-body-model ESD level of greater than 8 kV.
URI: http://dx.doi.org/10.1109/TMTT.2004.840733
http://hdl.handle.net/11536/23422
ISSN: 0018-9480
DOI: 10.1109/TMTT.2004.840733
期刊: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume: 53
Issue: 2
起始頁: 582
結束頁: 589
顯示於類別:會議論文


文件中的檔案:

  1. 000226910000021.pdf