標題: Measurement of Interlayer Screening Length of Layered Graphene by Plasmonic Nanostructure Resonances
作者: Chen, Hsiang-An
Hsin, Cheng-Lun
Huang, Yu-Ting
Tang, Ming Lee
Dhuey, Scott
Cabrini, Stefano
Wu, Wen-Wei
Leone, Stephen R.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 31-十月-2013
摘要: The variation in localized surface plasmon resonances of single Au nanodisks (diameter 100 nm and height 25 nm) on 0-13 graphene layers is investigated using dark-field scattering spectroscopy to obtain the graphene electric field screening length. For nanodisks (NDs) with and without underlying graphene layers on a SiO2 (300 nm)/Si substrate, the plasmon resonance red shifts from 604 to 620 nm with increasing graphene layers. The spectra of the plasmonic nanostructures obey an exponential saturation function versus increasing number of layers of graphene from 0 to 13. As a conducting film, the graphene layers screen the electric field generated by the plasmonic resonance of the Au NDs in the vicinity of the interface, and the red shifts of the resonance wavelength are explained in the framework of the electromagnetic field coupling between in-plane antiparallel image dipoles in the graphene layers and the ND dipole. A screening length of 1.2 +/- 0.2 nm, equivalent to 3-4 graphene layers, is experimentally obtained, in good agreement with the measurement by field-effect transistors and theoretical calculation in doped graphene. The resonance shift of plasmonic nanostructures on a layered graphene system provides an alternative and convenient method for screening length measurement of graphene films.
URI: http://dx.doi.org/10.1021/jp312363x
http://hdl.handle.net/11536/23298
ISSN: 1932-7447
DOI: 10.1021/jp312363x
期刊: JOURNAL OF PHYSICAL CHEMISTRY C
Volume: 117
Issue: 43
起始頁: 22211
結束頁: 22217
顯示於類別:期刊論文


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