標題: Overview of the Gas and Aerosol Metrology
作者: Tsai, C. J.
Aggarwal, S. G.
環境工程研究所
Institute of Environmental Engineering
關鍵字: Gas and aerosol metrology;Calibration standards;Traceability;Nanoparticle measurement;Air quality and vehicular emission regulations
公開日期: 1-九月-2013
摘要: There are several exciting developments noted in gas and aerosol measurements in recent years. On the other hand not much work has been done on the calibration facility, traceable standards, and certified reference materials for this field of science. More attention and concerns are needed for the comparable and SI traceable data quality in gas and aerosol measurements. The aim of this special issue of MAPAN-Journal of Metrology Society of India is to highlight such issues.
URI: http://dx.doi.org/10.1007/s12647-013-0075-8
http://hdl.handle.net/11536/23032
ISSN: 0970-3950
DOI: 10.1007/s12647-013-0075-8
期刊: MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA
Volume: 28
Issue: 3
起始頁: 141
結束頁: 143
顯示於類別:期刊論文


文件中的檔案:

  1. 000325897600001.pdf