Title: Memory device application of wide-channel in-plane gate transistors with type-II GaAsSb-capped InAs quantum dots
Authors: Liao, Yu-An
Chao, Yi-Kai
Chang, Shu-Wei
Chang, Wen-Hao
Chyi, Jen-Inn
Lin, Shih-Yen
Department of Electrophysics
Department of Photonics
Issue Date: 30-Sep-2013
Abstract: We demonstrate room-temperature electron charging/discharging phenomena of InAs quantum dots using wide-channel in-plane gate transistors. The device based on type-II GaAsSb-capped InAs quantum dots exhibits both the longer charging and discharging times than those of the type-I counterpart with GaAs capping layers. The slow charge relaxation of GaAsSb-capped InAs quantum dots and simple architecture of in-plane gate transistors reveal the potential of this device architecture for practical memory applications. (C) 2013 AIP Publishing LLC.
URI: http://dx.doi.org/10.1063/1.4824067
ISSN: 0003-6951
DOI: 10.1063/1.4824067
Volume: 103
Issue: 14
End Page: 
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