標題: Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging
作者: Chang, Hye Jung
Kalinin, Sergei V.
Morozovska, Anna N.
Huijben, Mark
Chu, Ying-Hao
Yu, Pu
Ramesh, Ramamoorthy
Eliseev, Evgeny A.
Svechnikov, George S.
Pennycook, Stephen J.
Borisevich, Albina Y.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 3-六月-2011
摘要: Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy (STEM) (a-STEM image, b-corresponding displacement profile) is combined with the Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions.
URI: http://dx.doi.org/10.1002/adma.201004641
http://hdl.handle.net/11536/22769
ISSN: 0935-9648
DOI: 10.1002/adma.201004641
期刊: ADVANCED MATERIALS
Volume: 23
Issue: 21
起始頁: 2474
結束頁: +
顯示於類別:期刊論文


文件中的檔案:

  1. 000291732000013.pdf