標題: Nanoscale characterization of emergent phenomena in multiferroics
作者: He, Q.
Arenholz, E.
Scholl, A.
Chu, Y. -H.
Ramesh, R.
材料科學與工程學系
Department of Materials Science and Engineering
關鍵字: Multiferroics;Magnetoelectrics;Photoemission electron microscope
公開日期: 1-十月-2012
摘要: Multiferroics exhibit intriguing physical properties and in turn promise new device applications as a result of the coupling between their order parameters. In this review article, we introduce photoemission electron microscopy (PEEM) as a powerful tool to study multiferroicity with the capability of probing the charge, spin and orbital states of a material simultaneously with nanoscale spatial resolution and element sensitivity. Several systematical studies of ferroelectricity, antiferromagnetism, and multiferroicity using PEEM are discussed. In the end, we outline several challenges remaining in multiferroic research, and how PEEM can be employed as an important characterization tool providing critical information to understand the emergent phenomena in multiferroics. Published by Elsevier Ltd.
URI: http://dx.doi.org/10.1016/j.cossms.2012.03.006
http://hdl.handle.net/11536/22619
ISSN: 1359-0286
DOI: 10.1016/j.cossms.2012.03.006
期刊: CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE
Volume: 16
Issue: 5
起始頁: 216
結束頁: 226
顯示於類別:期刊論文


文件中的檔案:

  1. 000322938500002.pdf