標題: Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips
作者: Cheng, Hui-Wen
Chang, Yuan-Chih
Yuan, Chi-Tsu
Tang, Song-Nien
Chang, Chia-Seng
Tang, Jau
Chen, Fu-Rong
Pan, Rong-Long
Tseng, Fan-Gang
光電工程學系
Department of Photonics
公開日期: 27-六月-2013
摘要: This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.
URI: http://dx.doi.org/10.1021/jp401050t
http://hdl.handle.net/11536/22273
ISSN: 1932-7447
DOI: 10.1021/jp401050t
期刊: JOURNAL OF PHYSICAL CHEMISTRY C
Volume: 117
Issue: 25
起始頁: 13239
結束頁: 13246
顯示於類別:期刊論文


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  1. 000321236400038.pdf