標題: Measurement of Temperature Distribution in SnAg3.5 Flip-Chip Solder Joints during Current Stressing Using Infrared Microscopy
作者: Hsiao, Hsiang-Yao
Chen, Chih
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 2008
摘要: In this paper, the temperature distribution during electromigration in flip-chip SnAg3.5 solder bumps is directly examined using infrared microscopy. Two clear hot spots are observed in the bump. One is located at the region with peak current density, and the other one is at the bump edge under the current-feeding metallization on the chip side. Under a current stress of 1.06 x 10(4) A/cm(2), the temperature in the two hot spots are 161.7 degrees C and 167.8 degrees C, respectively, which surpass the average bump temperature of 150.5 degrees C. In addition, effect Of under-bump-metallization (UBM) thickness oil the hot spots is also examined. It indicates that the hot-spot temperature in the solder bump increases for the solder joints with a thinner UBM.
URI: http://hdl.handle.net/11536/2174
http://dx.doi.org/10.1109/EMAP.2008.4784283
ISBN: 978-1-4244-3619-4
DOI: 10.1109/EMAP.2008.4784283
期刊: 2008 EMAP CONFERENCE PROCEEDINGS
起始頁: 281
結束頁: 284
顯示於類別:會議論文


文件中的檔案:

  1. 000264237400065.pdf