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dc.contributor.authorChen, KSen_US
dc.contributor.authorPearn, WLen_US
dc.date.accessioned2014-12-08T15:01:21Z-
dc.date.available2014-12-08T15:01:21Z-
dc.date.issued1997-11-01en_US
dc.identifier.issn0748-8017en_US
dc.identifier.urihttp://hdl.handle.net/11536/215-
dc.description.abstractNumerous process capability indices, including C-p, C-pk, C-pm, and C-pmk, have been proposed to provide measures of process potential and performance. In this paper, we consider some generalizations of these four basic indices to cover non-normal distributions. The proposed generalizations are compared with the four basic indices. The results show that the proposed generalizations are more accurate than those basic indices and other generalizations in measuring process capability. We also consider an estimation method based on sample percentiles to calculate the proposed generalizations, and give an example to illustrate how we apply the proposed generalizations to actual data collected from the factory. (C) 1997 John Wiley & Sons, Ltd.en_US
dc.language.isoen_USen_US
dc.subjectprocess capability indexen_US
dc.subjectprocess meanen_US
dc.subjectprocess standard deviationen_US
dc.subjectpercentileen_US
dc.titleAn application of non-normal process capability indicesen_US
dc.typeArticleen_US
dc.identifier.journalQUALITY AND RELIABILITY ENGINEERING INTERNATIONALen_US
dc.citation.volume13en_US
dc.citation.issue6en_US
dc.citation.spage355en_US
dc.citation.epage360en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000071421900004-
dc.citation.woscount15-
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