標題: Measuring PPM Non-conformities for Processes with Asymmetric Tolerances
作者: Pearn, W. L.
Wu, C. H.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: Asymmetric tolerances;non-conformity;process yield;target
公開日期: 1-Apr-2013
摘要: Process yield has been the most basic and common criterion used in the manufacturing industry for evaluating process capability. The Cpk index has been used widely in the manufacturing industry. In this note, we considered a generalization of Cpk index which handles processes involving a target T with asymmetric tolerances. Particularly, we established a formula for measuring the PPM non-conformities for given ratios of the two-side tolerances. We proved the validity of the established formula and tabulated the upper bounds on PPM non-conformities for various given Cpk index values and ratios of the two-side tolerances. Copyright (c) 2012 John Wiley & Sons, Ltd.
URI: http://dx.doi.org/10.1002/qre.1401
http://hdl.handle.net/11536/21356
ISSN: 0748-8017
DOI: 10.1002/qre.1401
期刊: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume: 29
Issue: 3
起始頁: 431
結束頁: 435
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