Title: Bipolar switching characteristics of low-power Geo resistive memory
Authors: Cheng, C. H.
Chen, P. C.
Liu, S. L.
Wu, T. L.
Hsu, H. H.
Chin, Albert
Yeh, F. S.
Department of Electronics Engineering and Institute of Electronics
Keywords: Resistive random access memory (RRAM);Germanium oxide (GeO(2))
Issue Date: 1-Aug-2011
Abstract: We reported an ultra low-power resistive random access memory (RRAM) combining a low-cost Ni electrode and covalent-bond GeO(x) dielectric. This cost-effective Ni/GeO(x)/TaN RRAM device has very small set power of 2 mu W, ultra-low reset power of 130 pW, greater than 1 order of magnitude resistance window, and stable retention at 85 degrees C. The current flow at low-resistance state is governed by Poole-Frenkel conduction with electrons hopping via defect traps, which is quite different from the filament conduction in metal-oxide RRAM. (C) 2011 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.sse.2011.04.010
ISSN: 0038-1101
DOI: 10.1016/j.sse.2011.04.010
Volume: 62
Issue: 1
Begin Page: 90
End Page: 93
Appears in Collections:Articles

Files in This Item:

  1. 000292444000015.pdf