|標題:||A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"|
|作者:||Pearn, W. L.|
Wu, C. H.
Tsai, M. C.
Department of Industrial Engineering and Management
|關鍵字:||critical values;lower confidence bounds;multiple characteristics;one-sided specification;process capability index|
|摘要:||The generalized yield index C-pk(T) establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C-PU(T) was considered, and the asymptotic distribution of the natural estimator (C)over-cap(PU)(T) was developed. Then, we derived the lower confidence bounds as well as the critical values of index C-PU(T). We not only provided some tables but also presented an application example. Copyright (c) 2012 John Wiley & Sons, Ltd.|
|期刊:||QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL|