標題: A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"
作者: Pearn, W. L.
Wu, C. H.
Tsai, M. C.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: critical values;lower confidence bounds;multiple characteristics;one-sided specification;process capability index
公開日期: 1-三月-2013
摘要: The generalized yield index C-pk(T) establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C-PU(T) was considered, and the asymptotic distribution of the natural estimator (C)over-cap(PU)(T) was developed. Then, we derived the lower confidence bounds as well as the critical values of index C-PU(T). We not only provided some tables but also presented an application example. Copyright (c) 2012 John Wiley & Sons, Ltd.
URI: http://dx.doi.org/10.1002/qre.1295
http://hdl.handle.net/11536/21191
ISSN: 0748-8017
DOI: 10.1002/qre.1295
期刊: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume: 29
Issue: 2
起始頁: 159
結束頁: 163
顯示於類別:期刊論文


文件中的檔案:

  1. 000315198300002.pdf