標題: Cumulative Differential Non linearity Testing of ADCs
作者: Chen, Hungkai
Ho, Yingchieh
Su, Chauchin
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: cumulative differential nonlinearity;gain error;jitter calibration;analog-to-digital converters (ADCs)
公開日期: 1-十月-2012
摘要: This paper proposes a cumulative DNL (CDNL) test methodology for the BIST of ADCs. It analyzes the histogram of the DNL of a predetermined k LSBs distance to determine the DNL and gain error. The advantage of this method over others is that the numbers of required code bins and required samples are significantly reduced. The simulation and measurements of a 12-bit ADC show that the proposed CDNL has an error of less than 5% with only 2(12) samples, which can only be achieved with 2(22) samples using the conventional method. It only needs 16 registers to store code bins in this experiment.
URI: http://dx.doi.org/10.1587/transfun.E95.A.1768
http://hdl.handle.net/11536/20689
ISSN: 0916-8508
DOI: 10.1587/transfun.E95.A.1768
期刊: IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES
Volume: E95A
Issue: 10
起始頁: 1768
結束頁: 1775
顯示於類別:期刊論文


文件中的檔案:

  1. 000310397900014.pdf