標題: Reconstruction of surface profile by using heterodyne moire method
作者: Chang, Wei-Yao
Hsu, Fan-Hsi
Chen, Kun-Huang
Chen, Jing-Heng
Hsieh, Hung-Chih
Hsu, Ken Y.
光電工程學系
Department of Photonics
關鍵字: Surface profile measurement;Moire;Heterodyne interferometry
公開日期: 1-十一月-2012
摘要: Based on the projection moire method and heterodyne interferometry, this study proposes an alternative method for reconstructing the surface profile of an object. Obliquely illuminating a linear grating with an expanding collimated light, a self-image of this grating can be generated and projected on the surface of the tested object. The grating fringes distorted by the surface profile are imaged on the reference grating to form the moire fringes. These moire fringes are then captured by a CMOS camera. If the projection grating moves with a constant velocity along the grating plane, each pixel of the CMOS camera records a series of sampling points of the sinusoidal wave. These sinusoidal waves behave like heterodyne interferometric signals. Hence, the accurate and stable phase distribution of the tested object surface can be obtained using the IEEE 1241 least-squares sine fitting algorithm and 20 phase unwrapping. Substituting the phase values into the derived equation, the surface profile of the tested object can be reconstructed. The experiments in this study verified the feasibility of this method, showing a measurement resolution of approximately 1.9 mu m. The proposed measurement method has the merits of both the projection moire method and the heterodyne interferometry. (C) 2012 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.optcom.2012.07.079
http://hdl.handle.net/11536/20641
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2012.07.079
期刊: OPTICS COMMUNICATIONS
Volume: 285
Issue: 24
起始頁: 5337
結束頁: 5340
顯示於類別:期刊論文


文件中的檔案:

  1. 000311196500103.pdf