標題: Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy
作者: Strelcov, E.
Kim, Y.
Yang, J. C.
Chu, Y. H.
Yu, P.
Lu, X.
Jesse, S.
Kalinin, S. V.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 5-十一月-2012
摘要: The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V-ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V-ac is a necessary step to establish the veracity of PFM hysteresis measurements. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764939]
URI: http://dx.doi.org/10.1063/1.4764939
http://hdl.handle.net/11536/20626
ISSN: 0003-6951
DOI: 10.1063/1.4764939
期刊: APPLIED PHYSICS LETTERS
Volume: 101
Issue: 19
結束頁: 
顯示於類別:期刊論文


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  1. 000311320100046.pdf