標題: A simple transmission line de-embedding method for accurate RF CMOS noise modeling
作者: Guo, JC
Huang, CH
Lien, WY
Wu, CM
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2004
摘要: We propose a simple method to de-embed the transmission line and pads' parasitics from the measured RF noise of multi-finger MOSFETs with aggressive gate length scaling down to 80 nm and 65 nm respectively. Good agreement has been realized between measurement and simulation in terms of S-parameters and NFmin (minimum noise figure) for RF CMOS devices with various finger numbers by using this novel de-embedding method. The extracted NFmin after de-embedding matches well with the published noise correlation matrix method but is relatively simple without resort to complicated matrices calculation.
URI: http://hdl.handle.net/11536/18225
http://dx.doi.org/10.1109/RFIC.2004.1320694
ISBN: 0-7803-8333-8
ISSN: 1529-2517
DOI: 10.1109/RFIC.2004.1320694
期刊: 2004 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS
起始頁: 607
結束頁: 610
Appears in Collections:Conferences Paper


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