|標題:||Oscillation ring based interconnect test scheme for SOC|
|作者:||Li, Katherine Shu-Min|
Lee, Chung Len
Chen, Jwu E.
Department of Electronics Engineering and Institute of Electronics
|摘要:||We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and crosstalk glitches. IEEE P1500 wrapper cells are modified. An efficient ring-generation algorithm is proposed to construct ORs based on a graph model. Experimental results on MCNC benchmark circuits show the feasibility of the scheme and the effectiveness of the algorithm. Our method achieves 100% fault coverage with a small number of tests.|
|期刊:||ASP-DAC 2005: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2|
|Appears in Collections:||Conferences Paper|