標題: IDENTIFYING UNTESTABLE FAULTS IN SEQUENTIAL-CIRCUITS
作者: LIANG, HC
LEE, CL
CHEN, JE
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-九月-1995
摘要: This article proposes an efficient method to identify untestable faults in sequential circuits. It uses a controllability calculation and symbolic simulation procedure that propagates the characteristics of unknown initial flip-flop states throughout the circuit. Identifying flip-flops that cannot be initialized and circuit lines that cannot be justified to definite values, this process classifies and identifies four types of untestable faults. Experimental results show that it improves the efficiency of a test generation system.
URI: http://dx.doi.org/10.1109/MDT.1995.466367
http://hdl.handle.net/11536/1770
ISSN: 0740-7475
DOI: 10.1109/MDT.1995.466367
期刊: IEEE DESIGN & TEST OF COMPUTERS
Volume: 12
Issue: 3
起始頁: 14
結束頁: 23
顯示於類別:期刊論文


文件中的檔案:

  1. A1995RP81200006.pdf