標題: Adaptive encoding scheme for test volume/time reduction in SoC scan testing
作者: Lin, SP
Lee, CL
Chen, JE
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2005
摘要: application time. In this paper, we propose and demonstrate an Adaptive Encoding scheme to reduce the test volume and test time for SoC scan test. The scheme, instead of handling test data themselves, encodes them in "packets" according to difference hits of two consecutive test patterns. A decoder machine is designed to decode the compressed data and a repeat filling mechanism from the ATE is adopted to eliminate the synchronization problem. It supports variable block size and is flexible in encoding multi-core test patterns; therefore, the proposed method is effective in SoC scan test. Experimental results show that on average the scheme achieves 73% reduction in test data and more than 16 times of speedup in test application time.
URI: http://hdl.handle.net/11536/17688
ISBN: 0-7695-2481-8
ISSN: 1081-7735
期刊: 14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS
起始頁: 324
結束頁: 329
Appears in Collections:Conferences Paper