Title: LOG filter based inspection of cluster Mura and vertical-band Mura on liquid crystal displays
Authors: Chen, HC
Fang, LT
Lee, L
Wen, CH
Cheng, SY
Wang, SJ
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: laplacian of Gaussian;Mura defects;Mura detection;SEMU
Issue Date: 2005
Abstract: In this paper, we propose the use of Laplacian of Gaussian (LOG) filters in the detection of Cluster Mura defects and Vertical-Band Mura defects on Liquid Crystal Displays. To detect Cluster Mura defects, 2-D LOG filters with their shapes matching the shapes of Cluster Mura are adopted. The optimal threshold for the detection of Cluster Mura is determined based on the SEMU formula. On the other hand, to detect Vertical-Band Mura, a 1-D LOG filter is used over the projected I-D intensity profile to check if the variation tendency of the intensity profile is changed. The portions with inconsistently intensity variation are regarded as the portions where V-Band Muras occur. The simulation results demonstrate the LOG filters are very useful in the detection of Mura defects.
URI: http://hdl.handle.net/11536/17602
http://dx.doi.org/10.1117/12.586688
ISBN: 0-8194-5652-7
ISSN: 0277-786X
DOI: 10.1117/12.586688
Journal: Machine Vision Applications in Industrial Inspection XIII
Volume: 5679
Begin Page: 257
End Page: 265
Appears in Collections:Conferences Paper


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