標題: An AOI Approach for IC Lead Index Auto-verification
作者: Perng, Der-Baau
Chang, Guei-Ci
Lee, Shu-Ming
Chen, Ssu-Han
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: substrate;lead verification;particle swarm optimization
公開日期: 2010
摘要: To wire-bond automatically, the IC lead positions on the CAD drawing and the corresponding ones on the extracted substrate image should be pre-verified. This paper proposed an AOI approach for IC lead index auto-verification which conquered the lead shape distortion, golden exposed, shifting, rotation, and scaling difficulties of extracted substrate image. Experimentations revealed that the proposed AOI approach can accurately verify the corresponding leads between a CAD drawing and the extracted substrate image with high repeatability.
URI: http://hdl.handle.net/11536/17416
http://dx.doi.org/10.1117/12.886015
ISBN: 978-0-81947-940-2
ISSN: 0277-786X
DOI: 10.1117/12.886015
期刊: 6TH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION
Volume: 7544
Appears in Collections:Conferences Paper


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