標題: Automatic mura detection system for liquid crystal display panels - art. no. 60700G
作者: Fang, LT
Chen, HC
Yin, IC
Wang, SJ
Wen, CH
Kuo, CH
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Laplacian of Gaussian;Mura defect;Mura detection;SEMU;automatic inspection
公開日期: 2006
摘要: In this paper, we propose an automatic inspection system, which can automatically detect four types of muras on an LCD panel: cluster mura, v-band mura, rubbing mura, and light leakage mura. To detect cluster muras, the Laplacian of Gaussian (LOG) filter is used. A multi-resolution approach is proposed to detect cluster muras of different scales. To speed up the processing speed, this multi-resolution approach is actually implemented in the frequency domain. To detect v-band muras, we check the variation tendency of the projected I-D intensity profile. Then, v-band muras are detected by identifying these portions of the I-D profile where a large deviation occurs. To detect rubbing muras, we designed a frequency mask to detect distinct components in the frequency domain. To detect light leak muras, we apply image mirroring over the boundary parts and adopt the same LOG filter that has been used in detecting cluster muras. All four types of mura detection are integrated together in an efficient way and simulation results demonstrate that this system is indeed very helpful in detecting mura defects.
URI: http://hdl.handle.net/11536/17136
http://dx.doi.org/10.1117/12.650686
ISBN: 0-8194-6110-5
ISSN: 0277-786X
DOI: 10.1117/12.650686
期刊: Machine Vision Applications in Industrial Inspection XIV
Volume: 6070
起始頁: G700
結束頁: G700
Appears in Collections:Conferences Paper


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