標題: Near-field scanning optical microscopy using a super-resolution cover glass slip
作者: Lin, Yu-Hsuan
Tsai, Din Ping
電子物理學系
Department of Electrophysics
公開日期: 16-Jul-2012
摘要: This study presents a novel near-field optics technology. A near-field cover glass slip (NF-CGS) was developed to improve the resolution of optical microscopy beyond the diffraction limit. A multi-layered structure of cover glass/ZnS-SiO2 (130 nm)/AgOx (15 nm)/ ZnS-SiO2 (40 nm) was employed to generate the optical coupling effect for increasing the contrast and enhancing resolution of imaging. This novel innovation is expected to be employed in near-field imaging techniques for samples in different environments because of its simplicity, rapid laser scanning, and minimal costs. Experimental results of 500 nm, 200 nm, and 100 nm standard polystyrene nanospheres on NF-CGS and normal cover glass are demonstrated and imaged by using a laser scanning confocal microscope. (C) 2012 Optical Society of America
URI: http://dx.doi.org/10.1364/OE.20.016205
http://hdl.handle.net/11536/16936
ISSN: 1094-4087
DOI: 10.1364/OE.20.016205
期刊: OPTICS EXPRESS
Volume: 20
Issue: 15
起始頁: 16205
結束頁: 16211
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