標題: Evidence of Sharp and Diffuse Domain Walls in BiFeO3 by Means of Unit-Cell-Wise Strain and Polarization Maps Obtained with High Resolution Scanning Transmission Electron Microscopy
作者: Lubk, A.
Rossell, M. D.
Seidel, J.
He, Q.
Yang, S. Y.
Chu, Y. H.
Ramesh, R.
Hytch, M. J.
Snoeck, E.
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 1-一月-1970
摘要: "Domain walls (DWs) substantially influence a large number of applications involving ferroelectric materials due to their limited mobility when shifted during polarization switching. The discovery of greatly enhanced conduction at BiFeO3 DWs has highlighted yet another role of DWs as a local material state with unique properties. However, the lack of precise information on the local atomic structure is still hampering microscopical understanding of DW properties. Here, we examine the atomic structure of BiFeO3 109 degrees DWs with pm precision by a combination of high-angle annular dark-field scanning transmission electron microscopy and a dedicated structural analysis. By measuring simultaneously local polarization and strain, we provide direct experimental proof for the straight DW structure predicted by ab initio calculations as well as the recently proposed theory of diffuse DWs, thus resolving a long-standing discrepancy between experimentally measured and theoretically predicted DW mobilities."
URI: http://dx.doi.org/47601
http://hdl.handle.net/11536/16748
ISSN: 0031-9007
DOI: 47601
期刊: PHYSICAL REVIEW LETTERS
Volume: 109
Issue: 4
結束頁: 
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