標題: Optical Studies of GaAs Nanowires Grown on Trenched Si(001) Substrate by Cathodoluminescence
作者: Lee, Ling
Chien, Kun-Feng
Fan, Wen-Chung
Chou, Wu-Ching
Ko, Chih-Hsin
Wu, Cheng-Hsien
Lin, You-Ru
Wan, Cheng-Tien
Wann, Clement H.
Hsu, Chao-Wei
Chen, Yung-Feng
Su, Yan-Kuin
電子物理學系
Department of Electrophysics
公開日期: 1-六月-2012
摘要: "The strains in GaAs nanowires, which were grown from 1700- to 80-nm-wide trenches on the Si(001) wafer with SiO2 masks, were investigated by cathodoluminescence. For 1700- to 500-nm-wide trenches, the in-plane tensile strain at 15 K decreases with the decreasing trench width. The strain increases abruptly when the trench width is 300 nm, and then decreases as the trench width is further decreased. The results revealed that the stress induced by the SiO2 sidewalls dominates when the width is less than the depth of the trench. This approach provides an effective technique to measure the strain of a single nanowire and helps for the demonstration of selectively-grown GaAs with a designed strain. (C) 2012 The Japan Society of Applied Physics"
URI: http://dx.doi.org/06FG15
http://hdl.handle.net/11536/16664
ISSN: 0021-4922
DOI: 06FG15
期刊: JAPANESE JOURNAL OF APPLIED PHYSICS
Volume: 51
Issue: 6
結束頁: 
顯示於類別:期刊論文


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  1. 000306189800099.pdf