標題: Diagnostic test-pattern generation targeting open-segment defects and its diagnosis flow
作者: Chen, Y. -H.
Chang, C. -L.
Wen, C. H. -P.
電機工程學系
Department of Electrical and Computer Engineering
公開日期: 1-五月-2012
摘要: As an open defect occurs in one wire segment of the circuit, different logic values on the coupling wires of the physical layout may result in different faulty behaviours, which are so called the Byzantine effect. Many previous researches focus on the test and diagnosis of open defects but the pattern diagnosability has not properly addressed. Therefore in this study, a high-resolution diagnostic framework for open defects is proposed and consists of a diagnostic test-pattern generation (DTPG) and its diagnosis flow. The branch-and-bound search associated with controllability analysis is incorporated in satisfiability-based DTPG to generate patterns for the target segment. Later, a precise diagnosis flow constructs the list of defect candidates in a dictionary-based fashion followed by an inject-and-evaluate analysis to greatly reduce the number of candidates for silicon inspection. Experimental results show that the proposed framework runs efficiently and deduces nearly one candidate for each open-segment defect on average among all ISCAS'85 benchmark circuits.
URI: http://hdl.handle.net/11536/16537
ISSN: 1751-8601
期刊: IET COMPUTERS AND DIGITAL TECHNIQUES
Volume: 6
Issue: 3
結束頁: 186
顯示於類別:期刊論文


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