標題: Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability
作者: Yuan, Jiann-Shiun
Yen, Hsuan-Der
Chen, Shuyu
Wang, Ruey-Lue
Huang, Guo-Wei
Juang, Ying-Zong
Tu, Chih-Ho
Yeh, Wen-Kuan
Ma, Jun
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Cascode class E;gate oxide breakdown;output power;power amplifier (PA);power efficiency;reliability
公開日期: 1-六月-2012
摘要: A cascode class-E power amplifier (PA) operating at 5.2 GHz has been designed using Advanced Design System simulation. RF circuit performances such as output power and power-added efficiency before and after RF stress have been experimentally investigated. The measured output power, power-added efficiency, and linearity after high-input-power RF stress at elevated supply voltage show significant circuit degradations. The impact of hot-carrier injection and gate oxide soft breakdown on cascode class-E PA reliability is discussed.
URI: http://hdl.handle.net/11536/16522
ISSN: 1530-4388
期刊: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume: 12
Issue: 2
結束頁: 369
顯示於類別:期刊論文


文件中的檔案:

  1. 000305085100024.pdf