標題: Study of intrinsic characteristics of ESD protection diodes for high-speed I/O applications
作者: Yeh, Chih-Ting
Ker, Ming-Dou
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-六月-2012
摘要: To meet the desired electrostatic discharge (ESD) robustness, ESD diodes was added into the I/O cells of integrated circuits (ICs). However, the parasitic capacitance from the ESD diodes often caused degradation on circuit performance, especially in the high-speed I/O applications. In this work, two modified layout styles to effectively improve the figures of merits (FOMs) of ESD protection diodes have been proposed, which are called as multi-waffle and multi-waffle-hollow layout styles. Experimental results in a 90-nm CMOS process have confirmed that the FOMs (R-ON * C-ESD, I-CP/C-ESD,C- V-HBM/C-ESD, and I-CP/A(Layout)) of ESD protection diodes with new proposed layout styles can be successfully improved. (C) 2011 Elsevier Ltd. All rights reserved.
URI: http://hdl.handle.net/11536/16514
ISSN: 0026-2714
期刊: MICROELECTRONICS RELIABILITY
Volume: 52
Issue: 6
結束頁: 1020
顯示於類別:期刊論文


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  1. 000305264600012.pdf