標題: Two-stage trigger silicon-controller rectifier (SCR) for radio-frequency (RF) input and output protections in nanometer technologies
作者: Lee, Jian-Hsing
Wu, Yi-Hsun
Huang, Shao-Chang
Lee, Yu-Huei
Chen, Ke-Horng
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: DTSCR;SSP;TSDS;TST;ESD;TLP;V-t1
公開日期: 1-八月-2012
摘要: In this paper, a two-stage trigger (TST) scheme is proposed to implement a low-capacitance and zero-ohm input resistance electrostatic-discharge (ESD) protection device for nanometer technology applications. Besides the main trigger device diode string, the output transistor can also be used as the trigger device. The dimension of the main trigger device can be reduced for minimizing its capacitance with the additional trigger device. Moreover, the output transistor can be as the driving device without any series resistor. This is because the diode string can help to prevent integrated circuits (ICs) from ESD damage before the primary ESD protection device turns on. (c) 2012 Elsevier Ltd. All rights reserved.
URI: http://hdl.handle.net/11536/16425
ISSN: 0038-1101
期刊: SOLID-STATE ELECTRONICS
Volume: 74
Issue: 
結束頁: 134
顯示於類別:期刊論文


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  1. 000305728600023.pdf