標題: The First Order Optics of Novel Testing Equipment for Compact Camera Module
作者: Pan, Jui-Wen
光電系統研究所
Institute of Photonic System
關鍵字: compact camera module;magnification;reduction ratio;CMOS sensor
公開日期: 2010
摘要: We proposed a modified testing equipment for adjusting the back focal length of compact camera module (CCM). The advantages of this modified testing equipment with conversion lens were testing space saving, small size testing chart, high speed chart changing, and variable object distances. The testing chart displacement of 0.17 mm in the modified testing equipment can produce the equivalent testing chart displacement of 1000 mm in the conventional testing equipment. At the regular object distance of 2000 mm, both total track and testing chart size of the modified test equipment were 1.6% of that of the conventional testing equipment.
URI: http://hdl.handle.net/11536/16324
http://dx.doi.org/10.1117/12.868798
ISBN: 978-0-81948-082-8
ISSN: 0277-786X
DOI: 10.1117/12.868798
期刊: INTERNATIONAL OPTICAL DESIGN CONFERENCE 2010
Volume: 7652
Appears in Collections:Conferences Paper


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